Test Name | Status | Notes | Modified |
---|---|---|---|
Board Status | 1 | Sent to Dorigo for NSE x-ray Bottom NSE removed and replaced by Dorigo ZG06/11/14: tested with high rate and compression, passed both top and bottom ZG26/01/15: replaced components: C25_Nb, C29_Nb, C275, C280, CC11, C213, C399 | 10-02-2015 |
nse lookup | 1 | Works after Dorigo. | 07-11-2014 |
nse communication | 1 | top half passed
bottom failed
After rework
bottom passed | 16-11-2013 |
nse lookup | 0 | Top Passes, bottom fails (as expected as NSE communication is bad -- just double checking this) | 02-06-2011 |
assembly | 1 | 27-05-2011 | |
ddr reset | 1 | 27-05-2011 | |
test fifo | 1 | 27-05-2011 | |
qpll lock | 1 | 27-05-2011 | |
patch panel | 1 | 27-05-2011 | |
ttc connectivity | 1 | initially thought this test was failing. I double checked and found out the cards was in test mode. After reruning the thest with the rod on data mod, the card passed. | 27-05-2011 |
slink | 1 | 27-05-2011 | |
optical loop | 1 | Initially thought there was a problem with the test. Two modifications were made: Went back to archive/V2test03608.xsvf firmware (V2) and found set of non-problematic cables. | 26-05-2011 |
sram | 0 | top half passed the test
bottom half failed: fails for all txs, bit errors histogram for all bits ~ 65k, for a given test, "Data Read" remains the same for all addresses, the value of "Data Read" changes from test to test. | 25-05-2011 |
dram | 1 | 25-05-2011 | |
loop data | 1 | 25-05-2011 | |
V4B temp | 1 | 17-05-2011 | |
V4T temp | 1 | 17-05-2011 | |
I3V proms | 1 | 17-05-2011 | |
I5V proms | 1 | 17-05-2011 | |
connectivity | 1 | 17-05-2011 | |
proms load | 1 | 17-05-2011 | |
I3V initial | 1 | 17-05-2011 | |
I5V_initial | 1 | 17-05-2011 | |
U82 | 1 | 17-05-2011 | |
U81 | 1 | 17-05-2011 | |
U35 | 1 | 17-05-2011 | |
U34 | 1 | 17-05-2011 | |
U33 | 1 | 17-05-2011 | |
U32 | 1 | 17-05-2011 | |
U31 | 1 | 17-05-2011 | |
fuses | 1 | 13-05-2011 |